Información de la revista

EPL (EPL-EUROPHYS LETT)

EPL Association, EPS, Mulhouse

http://iopscience.iop.org/0295-5075

ISSN: 0295-5075

Idioma: Inglés

Revista técnica: Sí

JCR: Sí

Índice de impacto JCR: 1.947 (2020)   1.958 (2019)   1.886 (2018)   1.834 (2017)   1.957 (2016)   1.963 (2015)   2.095 (2014)   2.269 (2013)   2.260 (2012)   2.171 (2011)   2.753 (2010)   2.893 (2009)   2.203 (2008)   2.206 (2007)   2.229 (2006)   2.237 (2005)   2.120 (2004)   2.360 (2002)

Cuartil WoS: Q3 (2020)  Q2 (2019)  Q2 (2018)  Q2 (2017)  Q2 (2016)  Q2 (2015)  Q2 (2014)  Q2 (2013)  Q2 (2012)  Q2 (2011)

Cuartil ScimagoJR: Q2 (2020)  Q2 (2019)  Q2 (2018)  Q2 (2017)  Q2 (2016)  Q2 (2014)  Q2 (2013)  Q2 (2012)  Q1 (2011)

Latindex: No

Publicaciones del IIT en esta revista

Moreno Barrado, A., Gago, R., Redondo-Cubero, A., Vázquez, L., Muñoz-Garcia, J., Cuerno, R., Lorenz, K., Castro, M. Ion damage overrides structural disorder in silicon surface nanopatterning by low-energy ion beam sputtering, EPL. 109 (4), 48003-p1-48003-p5, (Feb/2015)

Castro, M., Rivera, A., García-Barriocanal, J., Dominguez-Adame, F., Belous, A.G., Santamaria, J., Leon, C. Effects of reduced dimensionality in the relaxation dynamics of ionic conductors, EPL. 69 (5), 770-776, (Mar/2005)

EPL (EPL-EUROPHYS LETT)

EPL Association, EPS, Mulhouse

Publicaciones del IIT en esta revista

Moreno Barrado, A., Gago, R., Redondo-Cubero, A., Vázquez, L., Muñoz-Garcia, J., Cuerno, R., Lorenz, K., Castro, M. Ion damage overrides structural disorder in silicon surface nanopatterning by low-energy ion beam sputtering, EPL. 109 (4), 48003-p1-48003-p5, (Feb/2015)

Castro, M., Rivera, A., García-Barriocanal, J., Dominguez-Adame, F., Belous, A.G., Santamaria, J., Leon, C. Effects of reduced dimensionality in the relaxation dynamics of ionic conductors, EPL. 69 (5), 770-776, (Mar/2005)