Ir arriba
Información del artículo

Coupling of morphology to surface transport in ion-beam irradiated surfaces: Oblique incidence

J. Munoz-Garcia, R. Cuerno, M. Castro

We propose and study a continuum model for the dynamics of amorphizable surfaces undergoing ion-beam sputtering IBS at intermediate energies and oblique incidence. After considering the current limitations of more standard descriptions in which a single evolution equation is posed for the surface height, we overcome some of them by explicitly formulating the dynamics of the species that transport along the surface and by coupling it to that of the surface height proper. In this, we follow recent proposals inspired by ?hydrodynamic? descriptions of pattern formation in aeolian sand dunes and ion-sputtered systems. From this enlarged model and by exploiting the time-scale separation among various dynamical processes in the system, we derive a single height equation in which coefficients can be related to experimental parameters. This equation generalizes those obtained by previous continuum models and is able to account for many experimental features of pattern formation by IBS at oblique incidence, such as the evolution of the irradiation-induced thin amorphous layer, transverse ripple motion with nonuniform velocity, ripple coarsening, onset of kinetic roughening, and others. Additionally, the dynamics of the full two-field model is compared with that of the effective interface equation.

Palabras clave:

Physical Review B. Volumen: 78 Numero: 20 Páginas: 205408-1-205408-22

Índice de impacto JCR y cuartil Scopus: JCR impact factor: 3.322 (2008); 3.736 (2018).

Referencia DOI: DOI icon 10.1103/PhysRevB.78.205408    

Publicado en papel: Noviembre 2008.

J. Munoz-Garcia, R. Cuerno, M. Castro. Coupling of morphology to surface transport in ion-beam irradiated surfaces: Oblique incidence. Physical Review B. vol. 78, no. 20, pp. 205408-1-205408-22, Noviembre 2008.

    Líneas de investigación:

pdf  Previsualizar
pdf Solicitar el artículo completo a los autores

Aviso legal  |  Política de cookies |  Política de Privacidad

© Universidad Pontificia Comillas, Escuela Técnica Superior de Ingeniería - ICAI, Instituto de Investigación Tecnológica

Calle de Santa Cruz de Marcenado, 26 - 28015 Madrid, España - Tel: (+34) 91 5422 800