16th IEEE Instrumentation and Measurement Technology Conference - IMTC 1999, Venice (Italy). 24-26 mayo 1999
Keywords: Dielectric breakdown, Electric breakdown, Voltage, Fluctuations, Instruments, Stress, Low-frequency noise, Noise measurement, Microcomputers, Testing
Publication date: May 1999.
Citation:
Basso, G., Crupi, F., Neri, B., Giannetti, R., Lombardo, S., A novel characterization tool for the study of dielectric breakdown of ultra-thin oxide MOS structures, 16th IEEE Instrumentation and Measurement Technology Conference - IMTC 1999, Venice (Italy). 24-26 May 1999.
IIT-99-120A
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