17th IMEKO World Congress on Metrology in the 3rd Millenium, pp. 746-749, IMEKO TC-4, Dubrovnik (Croatia). 22-27 Junio 2003
Summary:
No disponible/Not available
Keywords: No disponible/Not available
Publication date: June 2003.
Citation:
Carpentieri, M., Silveira, J., Giannetti, R., A system for monitoring the spatial and intensity distribution on CCD patterns applied to in situ characterization, 17th IMEKO World Congress on Metrology in the 3rd Millenium, pp. 746-749, IMEKO TC-4, Dubrovnik (Croatia). 22-27 June 2003.
IIT-03-105A
Due to copyright restriction we cannot distribute this content on the web. However, using the next form you can contact the authors, which are allowed to redistribute a limited number of copies of it by email. Please, check your spam folder.
Legal notice | Cookies policy | Privacy policy
Calle de Santa Cruz de Marcenado, 26 - 28015 Madrid, Spain - Tel: (+34) 91 542 28 00
We use our own and third-party cookies to improve the functionality of our website and the quality of our service, by analyzing your browsing habits. I accept this site's cookies.
|
|