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Journal information

Applied Physics Letters (Appl Phys Lett)

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ISSN: 0003-6951

ISSN-L: 0003-6951

Language: English

Technical journal: Yes

JCR: Yes

JCR Impact factor: 3.597 (2019)   3.521 (2018)   3.495 (2017)   3.411 (2016)   3.142 (2015)   3.302 (2014)   3.515 (2013)   3.794 (2012)   3.844 (2011)   3.841 (2010)   3.554 (2009)   3.726 (2008)   3.596 (2007)   3.977 (2006)   4.127 (2005)   4.308 (2004)   4.207 (2002)

WoS quartile: Q1 (2019)  Q1 (2018)  Q1 (2017)  Q1 (2016)  Q1 (2015)  Q1 (2014)  Q1 (2013)  Q1 (2012)  Q1 (2011)

ScimagoJR quartile: Q1 (2019)  Q1 (2018)  Q1 (2017)  Q1 (2016)  Q1 (2014)  Q1 (2013)  Q1 (2012)  Q1 (2011)

Latindex: No

CIRC:

IIT Publications in this journal

Gago, R., Vázquez, L., Plantevin, O., Metzger, T.H., Munoz-Garcia, J., Cuerno, R., Castro, M. Order enhancement and coarsening of self-organized silicon nanodot patterns induced by ion-beam sputtering, Applied Physics Letters. 89 (23), 233101.1-233101.3, (Dec/2006)

Castro, M., Dominguez-Adame, F., Sánchez, A., Rodriguez, T. Model for crystallization kinetics: Deviations from Kolmogorov-Johnson-Mehl-Avrami kinetics, Applied Physics Letters. 75 (15), 2205-2207, (Oct/1999)

Piccirillo, A., Gobbi, A.L., Ferraris, M., Giannetti, R., Bagnoli, P.E. Identification of silicon nitride/InGaAs interface states, Applied Physics Letters. 56 (17), 1661-1663, (Apr/1990)

Applied Physics Letters (Appl Phys Lett)

,

IIT Publications in this journal

Gago, R., Vázquez, L., Plantevin, O., Metzger, T.H., Munoz-Garcia, J., Cuerno, R., Castro, M. Order enhancement and coarsening of self-organized silicon nanodot patterns induced by ion-beam sputtering, Applied Physics Letters. 89 (23), 233101.1-233101.3, (Dec/2006)

Castro, M., Dominguez-Adame, F., Sánchez, A., Rodriguez, T. Model for crystallization kinetics: Deviations from Kolmogorov-Johnson-Mehl-Avrami kinetics, Applied Physics Letters. 75 (15), 2205-2207, (Oct/1999)

Piccirillo, A., Gobbi, A.L., Ferraris, M., Giannetti, R., Bagnoli, P.E. Identification of silicon nitride/InGaAs interface states, Applied Physics Letters. 56 (17), 1661-1663, (Apr/1990)